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An effective silicon debug technique uses a trace buffer to monitor and capture a portion of the circuit response during its functional, post-silicon operation. Due to the limited space of the available trace buffer, selection of the critical trace signals plays an important role in both minimizing the number of signals traced and maximizing the observability/restorability of other untraced signals...
Diagnosis for delay defects becomes more significant as the CMOS process advances to nanometer regime. The most challenging problems of delay fault diagnosis in nanometer process come from the process variation, which results in small delay variations. Small delay variations are difficult to be diagnosed by using existing methods based on a specific fault model. This paper presents a new estimation...
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