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RIMS depth profiles have been measured for Cr and Ca in Genesis solar wind collector made from Si and compared to such measurements for ion‐implanted Si reference material. The presence of surface contamination has been shown to be a significant factor influencing the total Ca and Cr fluence measured in the Genesis collectors. A procedure to remove the contaminant signal from these depth profiles...
The thermal diffusion of an Mg implant in Si has been measured with SIMS and compared to RIMS (resonant ionisation mass spectrometry) measurements of Mg implantation and diffusion in Si wafers exposed to solar wind irradiation in the NASA Genesis mission. The Genesis samples show much more surface segregation that the samples annealed in the laboratory, due to diffusion and segregation of the implanted...
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