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We report on temperature characteristic of ultraviolet photoconductive detectors based on CeF3 thin films. These thin films are fabricated by pulsed laser deposition (PLD). We confirmed the increase of fluorine defect ratio of CeF3 thin film fabricated by higher laser power from X-ray diffraction. The current value of detector increases as the temperature rises due to thermal exciton. Additionally,...
We report on photoconductive detector based on CeF3 thin films in ultraviolet region. CeF3 thin films were grown by pulse laser deposition. The sensitivity spectrum of detector shows the response below 310 nm.
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