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In this paper nanocrystalline thin films of TiO2 doped with Tb have been investigated. Thin films were deposited on different (silicon and glass) substrates using modified magnetron sputtering method named High Energy. Structural properties were examined by X-Ray Diffraction (XRD) method. The results have shown, that phase and average crystallites size of prepared thin films were determined by the...
We investigated structural and magnetic properties of CoMnSi (CMS) Heusler alloy films and giant magneto-resistance (GMR) ratio of current-perpendicular-to-plane (CPP) GMR sensor elements. The films were deposited with magnetron sputtering method and annealed at 673 K and 773 K. The CMS films were identified as B2 structure by using X-ray diffraction and the magnetization of the films were evaluated...
CoFeB layer with amorphous structure has attracted much attention due to its soft magnetic properties and the realization of large tunnel magnetoresistance (TMR) ratio at room temperature when used as the free layer in ferromagnet/insulator/ferromagnet magnetic tunnel junctions. Two types of multilayer films were prepared in this study. Type I is a full stack of MTJs to evaluate the transport properties,...
The influence of annealing in various atmospheres on properties of the undoped SnO x thin films has been studied. The films with thickness of ∼400 nm have been deposited on glass substrate by a method of magnetron sputtering in argon–oxygen atmosphere at the pressure inside the chamber 0.9 and 2.7 Pa. The dependences of structural and optical properties of SnO x films from temperature...
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