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Single event effects and total dose performance trends of multiple generations of Xilinx FPGAs are reviewed. Their performance is compared to typical space mission requirements.
Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Virtex-5 FPGA are presented. Upset rates in the space radiation environment are estimated.
The proton induced SEU cross-section of the TMS320C6713 digital signal processor's functional blocks are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.
We investigated radiation hardness of phase conjugate mirrors (PCM) based on stimulated Brillouin scattering. Proton- and gamma-irradiated PCMs were tested in a single-frequency flash-lamp pumped Nd:YAG system. PCMs made of Lithosil show a good performance.
Dynamic single event upset characterization of the MT48LC4M32B2TG-6 SDRAM using proton irradiation is presented. The device's upset rate in the space radiation environment is estimated.
The proton induced SEU cross-sections of dynamic test designs implemented on Xilinx's Virtex-II and Spartan-3 FPGAs are presented. The cross-sections are used to estimate upset rates in the space radiation environment.
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