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In order to measure atomic number (Z) of materials, we present a Z identification method based on MV X-ray scattering spectra analysis in this paper. Scattering photons, which include positron annihilation photons, bremsstrahlung photons and Compton scattered photons, are generated by interactions of X-rays with matters and carry their Z information. A detector is used for...
Positron analysis can reveal the information of atomic level defect of materials like metals or polymers through the study of Doppler broaden 511keV ?? spectra of positron with electrons that have different momentum distributions relating with the inner defect of materials. The usually used positrons come from isotope or accelerator positron source that irradiates the materials with positrons from...
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