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Bulk-driven MOSFET technique meets the low-voltage and low-power requirements demanded in the modern analog circuit design. Due to submicron/nanometer technologies and critical short-channel effects, choosing a suitable MOSFET model for circuit design becomes increasingly important. However, the conventional MOSFET models normally set up for the typical gate-driven applications may not perform correctly...
In the nanometer regime, especially the RF and analog circuits exhibit wide parameter variability, and consequently every chip produced needs to be tested. On-chip design for testability (DfT) features, which are meant to reduce test time and cost also suffer from parameter variability. Therefore, RF calibration of all on-chip test structures is mandatory. In this paper, artificial neural networks...
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