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This study reports on spectroscopic ellipsometry (SE) and optical dispersion analysis of chemically deposited CdS thin films. The CdS thin films were prepared using chemical bath deposition and annealed in N2 atmosphere at temperatures of 100, 200, 300, and 500 °C for 60 min. The optical constants of nanocrystalline CdS thin films were investigated with SE. The ellipsometric parameters of the CdS...
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