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The aim of the presented work is to improve the quality of testing of SoC digital cores surrounded with test wrappers. The paper presents a new effective delay fault test generation method for the transition faults based on the skewed-load test. The generated delay fault test can be applied to a SoC core through a test wrapper architecture with only a simple boundary scan chain. This eliminates the...
The testing and verification technology for system HDL models, focused to the significant improvement of the quality of design components for digital systems on chips and reduction the development time (time-to-market) by using the simulation environment, testable analysis of the logical structure HDL-program and the optimal placement of assertion engine is proposed.
This paper presents a new type of a more complete system verification method, which combines a high-level verification methodology based on verification methodology manual (VMM) techniques for functional simulation and system-on-a-programmable-chip (SOPC) techniques for board-level verification, effectively improve the adequacy and reliability of verification and validation efficiency. This paper...
In this paper, we describe a CAD methodology for the full electrical characterization of high-performance, on-chip data buses. The goal of this methodology is to allow the accurate modeling and analysis of wide, on-chip data buses as early as possible in the design cycle. The modeling is based on a manufacturing (rather than design-manual) description of the back-end-of-the-line (BEOL) cross section...
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