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IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3373 - 3391
IEEE Transactions on Network and Service Management > 2017 > 14 > 4 > 934 - 948
IEEE Design & Test > 2017 > 34 > 6 > 27 - 35
IEEE Design & Test > 2017 > 34 > 6 > 46 - 53
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3539 - 3542
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3444 - 3454
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2017 > 7 > 4 > 523 - 533
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3138 - 3149
IEEE Transactions on Network and Service Management > 2017 > 14 > 4 > 890 - 903
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1290 - 1302
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 4 > 1779 - 1786
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1382 - 1386
IEEE Design & Test > 2017 > 34 > 6 > 36 - 45
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3401 - 3405
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3126 - 3137
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3281 - 3290
IEEE/ACM Transactions on Networking > 2017 > 25 > 6 > 3294 - 3308
IEEE Design & Test > 2017 > 34 > 6 > 63 - 76
IEEE Transactions on Network and Service Management > 2017 > 14 > 4 > 804 - 816
IEEE Transactions on Network and Service Management > 2017 > 14 > 4 > 875 - 889