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This paper presents an LVDS receiver compatible with ANSI and IEEE standards at 1.5 Gbps. The proposed receiver aims to be compatible with the standard over PVT corners and to have optimized power consumption using 150nm technology with two voltage supplies 3.3 and 1.8V. The receiver design methodology is explained and where is the critical specifications of the standard to be met for other different...
This paper summarizes the results of metalized film capacitor analysis made on capacitors of different manufacturers and types. The capacitors were operated for about 12 years in a power supply and served as a reactance to reduce the supply voltage without losing active energy. The capacitors were long stressed by continuous presence of voltage and current pulses. The measured results are reviewed...
Newest manufacturing technologies with feature sizes smaller than 20nm and FinFET devices have favored more restrictive design rules for manufacturability while suffering from electrical limitations of electromigration (EM) and variability. Designers can no longer reap the benefits in power, performance and area by simply relying on feature size miniature with contemporary design techniques. This...
A new technological solution to improve the beam-loss protection of silicon strip sensors used in large High Energy Physics experiments is presented. In the current ATLAS-SCT, sensors have Punch-Through protection (PTP) structures included to develop low impedance from the strip to the bias ring in case large voltages exceed some threshold that could damage the strip coupling capacitance. Previous...
When the universal-input applications are dealt with the power-factor-correction (PFC), there is always the problem of higher switch voltage stresses and higher inductor conduction losses. The paper has a topology namely buck-interleaved buck-boost (BuIBB) converter has lower switch voltage stresses and lower inductor conduction losses compared to other single-switch or two-switch converter topologies...
This paper describes the various input variables of an LED system (electronic driver and LED), such as component behavior, tolerance, thermal effects, and manufacturing variability — which all contribute to important end-use system parameters such as watts and total lumen output. A mathematical model with probability functions is constructed in Microsoft Excel to compute electrical parameters. Sensitivity...
The construction of black-box macromodels, either from frequency responses or via model order reduction, has become a standard practice in Computer-Aided Design flows of digital, analog, mixed-signal and radio-frequency systems. In order to be proficiently used, such macromodels need to be synthesized into equivalent circuits that are compatible with common circuit solvers. In this work, we propose...
Accurate measurement of FET gate resistance is needed to support technology development and to understand its impact on RF performance. This is especially true for high-K Metal Gate Fin FET technologies. Decreasing gate capacitance with each successive technology node has made gate resistance measurement increasingly difficult. This work presents a "Virtual De-Embedding" approach to the...
The purpose of this paper is to outline a method for calculating IEEE Std. 1584–2002 arc flash incident energy, taking into account the decrement in generator supplied fault current. The magnitude of fault current, for faults located close to generators, decrement rapidly. Arc flash exposure energy is calculated on a cycle by cycle basis for the duration of the fault. The energy during each cycle...
Design-Technology co-optimization becomes a key knob to enable CMOS scaling. In this work we evaluate the technology options including lithography options as well as device options that are considered to enable N10 scaling by exploring their impact on representative designs such as standard cells, SRAM and analog contexts. This paper illustrates that the design angle needs to be considered early in...
There is generally an absence of a methodology that explains the logic behind the design of the lightning protection, noise control and grounding system for a telecommunication facility. Common types of telecommunications sites that require grounding include radio sites, roof mounted cabinets or shelters, ground mounted cabinets and shelters, satellite sites, data centers, cable chambers and central...
Galvanometer is used for zero or balance indicating, plays an important role in the electrical, temperature and chemical metrology area. As a result of the existing galvanometer verification device can only work for current type galvanometer measurement, most laboratory can't measure voltage type galvanometer. In this paper, we designed a compound type galvanometer verification device which can both...
This paper presents a novel cipher text-policy attribute-based multi-use unidirectional proxy re-encryption scheme. In the proposed scheme, the tree access policy can be used to handle and (¡Ä), or (¡Å) and threshold (of) operators. We first formalize the security definition against chosen cipher text attack for cipher text-policy attribute-based multi-use unidirectional proxy re-encryption schemes,...
Many motor corporations in the world are developing electric vehicle (EV) nowadays. EV has high voltage system and the safety assurance for them is indispensable. This paper researches the principle of isolation resistance measurement based on domestic and foreign relevant standards and regulations, and explains the difference among different measurement methods with verification of actual test. This...
Impedance standards are very important tools in the field of electrical metrology. Therefore, capacitance, inductance, and resistance standards exist in all of the electrical laboratories, but with different accuracy levels. Design of a universal circuit, which can generate all of these quantities, is demonstrated in this paper. It is mainly based on microcontroller technique and electronic relays...
This paper describes realization of the ultrahigh-omic resistance scale in the range from 10 GΩ up to 100 TΩ at CMI. The scale realization is based on measurement of standards with different nominal values at various voltage levels, selected in such a way, that same nominal current is preserved during measurement of different standards. Measurement circuit consists of the measured standard, an electrometer...
At the National Metrology Institute of Japan, we are currently developing a transformer bridge circuit that can precisely compare the “i = 2” plateau resistance of an ac quantized Hall resistance with a 100-kO resistance. In this report, we propose a practical transformer voltage ratio of 7.75∶1, which is the most important parameter for developing a transformer bridge circuit. Further, we describe...
A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures...
We report in CPEM 2014 our latest results of the study of single quantum Hall device for the resistance standard in National Institute of Metrology, China (NIM). Experimental results indicate quantized Hall devices with satisfied longitudinal resistance, low contact resistance, and good breakdown current are obtained. Comparison of the quantum Hall resistance to a precise transfer resistance standard...
We reported the new design of quantum Hall array resistances. Two resistances, 100Ω and 1k𠄦, were achieved by series and parallel connections of single quantum Hall device based on the AlGaAs/GaAs heterostructure. The relative deviations from the nominal value were −3.42 parts of 108 for both design.
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