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Thin Solid Films > 2009 > 518 > 5 > 1484-1488
Nuclear Inst. and Methods in Physics Research, A > 2009 > 609 > 2-3 > 95-101
IEEE Transactions on Magnetics > 2009 > 45 > 1-2 > 372 - 376
IEEE Transactions on Magnetics > 2009 > 45 > 1-2 > 423 - 429
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 4 > 1054 - 1058
Solid State Electronics > 2008 > 52 > 11 > 1825-1828
Nuclear Inst. and Methods in Physics Research, A > 2008 > 586 > 2 > 153-159
IEEE Transactions on Plasma Science > 2008 > 36 > 1-1 > 112 - 124
IEEE Electron Device Letters > 2008 > 29 > 8 > 895 - 897
IEEE Electron Device Letters > 2008 > 29 > 12 > 1325 - 1327
IEEE Electron Device Letters > 2008 > 29 > 10 > 1132 - 1134
Nuclear Inst. and Methods in Physics Research, A > 2007 > 577 > 1-2 > 58-64
Measurement > 2007 > 40 > 3 > 294-299
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 584 - 587
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 4 > 1347 - 1354