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Costs as well as safety performance are usually taken into account in safety instrumented system design. Modeling a SIS is time consuming and fallible and altering a SIS design may lead to recreating the model, so it's difficult to compare one design with others effectively and quickly. Markov model and its automatic creation for SIS are described in this paper, followed by the analysis of SIS life...
In the process of product design, the combination of cost optimization and standard of robust design has become a key problem. Six sigma tolerance design model is proposed on the basis of dual response surface methodology where response mean equals its target in the target being best. Quality improvement and cost reduction are achieved with the model by minimizing response variance function and total...
In 65nm and smaller technologies, Vmin fails account for a substantial portion of the total fails seen in memories. Redundancy has traditionally been used to fix random point defects which can be modeled with Critical Area Analysis. As technologies migrate from 90 nm to 65nm, cost optimization requires consideration of Vmin yield fallout as well as random defects when selecting a SRAM memory redundancy...
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