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IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 704 - 714
IEEE Electron Device Letters > 2013 > 34 > 9 > 1100 - 1102
IEEE Transactions on Industry Applications > 2011 > 47 > 1 > 199 - 211
IEEE EUROCON 2009 > 278 - 281