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In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
In order to realization electronic parts product appearance quality detection control, one kind of processor based on the intelligent knowledge automatic extraction and system intelligence modeling was presented. In the processor, wavelet-fuzzy technique and neural network technique are combined. Uses the fuzzy wavelet extraction image feature, and wavelet function is used as fuzzy membership function...
Huge interest and demand on information superhighway have pressed various telecommunications research fronts and lead to a new form of future Internet consisting of wired and wireless segments where resource-constrained devices such as palm pilots and sensors may become integral parts of the Internet rather than access-only platforms. One of the key design problems is the security in such heterogeneous...
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