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IEEE Transactions on Dependable and Secure Computing > 2015 > 12 > 2 > 230 - 242
2009 International Conference on Test and Measurement > 2 > 438 - 442
IEEE Transactions on Dependable and Secure Computing > 2015 > 12 > 2 > 230 - 242
2009 International Conference on Test and Measurement > 2 > 438 - 442