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A TSV in a 3D IC could suffer from two major types of parametric faults — a resistive open fault, or a leakage fault. Dealing with these parametric faults (which do not destroy the functionality of a TSV completely but only degrade its quality or performance) is often trickier than dealing with a stuck-at fault. Previous works have not proposed a unified test structure and method that can characterize...
This paper proposes a novel tweleve-phase PWM dimming control for backlight inverter. We adopt tweleve-phase or six-phase PWM dimming to control the brightness of twelve lamps. Each phase can control one or two lamps. Circuit architecture is full bridge phase-shift circuit which can improve the total efficiency of the driving circuit. From the experimental results for four-phase and six-phase PWM...
This paper proposes a novel control scheme which possesses four-phase PWM dimming control for backlight inverter with triple output lamp currents for each phase. We adopt four-phase PWM dimming control circuit to control the brightness of twelve lamps. Each phase driving circuit can control three lamp currents. Circuit architecture is full bridge phase-shift circuit which can improve the total efficiency...
Latest VLSI circuits face the problem of power dissipation not only in design phase but also during testing phase. Power dissipation during testing may be increased up to three times more than that during normal operation. Testing power, testing time and test area overhead are the critical parameters to be optimized for large and complex VLSI circuits. Scan architectures are widely used in testing...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Field programmable gate arrays (FPGAs) are getting more and more attractive for military and aerospace applications, among others devices. The usage of non volatile FPGAs, like Flash-based ones, reduces permanent radiation effects but transient faults are still a concern. In this paper we propose a new methodology for effectively measuring the width of radiation-induced transient faults thus allowing...
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180 nm to 65 nm. The aim of this study is to establish the variation of sensitivity with technology node for SEU and MCU, and to analyze the possible influence of different designs and technological parameters at a given technology node.
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized...
With technology scaling, vulnerability to soft errors in random logic is increasing. There is a need for on-line error detection and protection for logic gates even at sea level. The error checker is the key element for an on-line detection mechanism. We compare three different checkers for error detection from the point of view of area, power and false error detection rates. We find that the double...
In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
In this paper, we investigate optimum radiation hardened by design (RHBD) for use against single-event transients (SET) using low-pass filters (LPF) including RHBD techniques against single-event upsets (SEU) for sequential logic in 45 -nm technology in a terrestrial environment. Three types of LPF were investigated regarding their SET pulse immunities, area penalties, and performance penalties. We...
This paper studies the impact of intra-die random variability on low-power digital circuit designs, specifically, circuit timing failures due to intra-die variability. We identify a new low-Vdd statistical failure mode that is strongly supply-voltage dependent and also introduce a simple yet novel method for quantifying the effects of process variability on digital timing - a delay overlapping stage...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
In the first part of this paper, an algorithm is derived for testing a given two state machine for the property of being universal. Various characterizations of universality are also obtained, and are stated in the form of necessary and sufficient conditions. The second part of this paper is concerned with the economical realization of sequential machines as networks of identical modules. Bounds are...
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