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This paper presents a method for radial shift estimation of an electrode array located around the forearm. The algorithm is aimed at band-shaped EMG human-machine interfaces recognising hand gestures. Proposed algorithm relies on the approximation of muscle activity in several regions arranged radially around user's forearm. The intensity is represented as a polygon on a polar plane. To estimate current...
This paper proposes a novel localization scheme to estimate the location of the mobile device by using single reference device. This scheme makes use of the bidirectional information of the line of sight (LOS) and non line of sight (NLOS) paths to construct the area of possible mobile device (APMD) and line of possible mobile device (LPMD) respectively. The location of the mobile device is determined...
This paper describes several methodologies based on a pulsed laser beam to reveal the architecture of a high integrated SDRAM, and the different classes of Single Event Effects that can occur due to cosmic radiations. At cell level, laser is used to reveal an important technological parameter: the lithography process. At memory array level, laser is a powerful tool to retrieve cell physical arrangements,...
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly...
In this paper, we investigate optimum radiation hardened by design (RHBD) for use against single-event transients (SET) using low-pass filters (LPF) including RHBD techniques against single-event upsets (SEU) for sequential logic in 45 -nm technology in a terrestrial environment. Three types of LPF were investigated regarding their SET pulse immunities, area penalties, and performance penalties. We...
For several decades, the output from semiconductor manufacturers has been high volume products with process optimisation being continued throughout the lifetime of the product to ensure a satisfactory yield. However, product lifetimes are continually shrinking to keep pace with market demands. Furthermore there is an increase in dasiafoundrypsila business where product volumes are low; consequently...
The challenges of deriving early-adopter competitive advantage, even with fabless access to process technology, through leveraging features offered by the advanced, and possibly disruptive, process technologies in real SoC products, are outlined. A structured methodology for addressing these challenges, and bridging the gap between process and design, sufficiently early in the development cycle to...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
We performed analyses of the frequency response of cloth inductors and thin-film inductors using an amorphous core, applying both to miniature dc-dc converters. Because these inductors are used in high-frequency bands from 1 to 100 MHz, the frequency dependence of the inductance L, capacitance C and resistance R in the inductors cannot be disregarded. The undetermined coefficients in a least-squares...
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