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This paper describes a technique of finding the noise figure of a 60 GHz LNA by extracting the equivalent noise resistance (Rn) of a MOSFET through on-wafer noise figure (F50) measurements at lower frequency (up to 18 GHz), while the other three noise parameters are extracted from S-parameter measurements beyond 60 GHz. This paper demonstrates how the gain-noise figure performance is optimized using...
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