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2011 International Reliability Physics Symposium > 5B.4.1 - 5B.4.7
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 2 > 270 - 283
IEEE Computer Architecture Letters > 2011 > 10 > 1 > 12 - 15
2010 East-West Design&Test Symposium (EWDTS) > 195 - 198