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High reliability crystal oscillators for extreme operating environments demands unique designs and processes for both the crystal and oscillator components. This paper addresses the development of a hybrid 5×7 mm AT cut crystal and oscillator circuit for extreme environment applications like jet engine controls, oil and gas well-logging including measure while drilling, geothermal systems, space craft...
Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which...
Asymmetric BTI aging in circuit paths has shown to cause a time dependent shift in the signal's duty cycle, affecting the performance of circuits such as low power SRAMs whose operation rely on both the positive and negative edges of the clock signal. In this work, we propose the first known on-chip reliability monitor to accurately characterize the impact of asymmetric BTI on SRAM read speed. Statistical...
For a design which is tolerant to parameter variations caused by process, voltage, temperature and aging, precise monitoring of the reliability status becomes a prerequisite. In applications such as medical implants reliability in combination with power efficiency is a crucial design goal. In the monitoring approach presented in this paper, circuit level timing properties are measured and utilized...
The estimation of dependable noise margins in digital cells is increasingly significant as nano-scale CMOS technology is facing true reliability issues. On one hand, a major concern comes from circuit aging mechanisms, such as NBTI, which degrade the reliability of circuit operation over time. On the other hand, variability in technology parameters results in affecting reliability. The impact of such...
The degradation of IC reliability is usually a gradual process, only causing moderate increase in the failure rate over time. However, under some specific circumstance, the degradation rate can be dramatically accelerated, leading to some catastrophic phenomena in digital and analog designs. Based on silicon data, this paper highlights such critical conditions, including severe frequency shift under...
Long-mission multiprocessor systems in which direct human intervention is impossible, like satellites in space, require special attention of their lifetime reliability. Relying on the well established power reduction techniques which are frequently used in multiprocessors - power and clock gating, as well as dynamic voltage and frequency scaling, we devise the Youngest-First Round-Robin (YFRR) core...
The time-dependent degradation (aging) of device characteristics caused by Bias Temperature Instability (BTI) and Hot-Carrier Injection (HCI) are one of the major threats to the reliability of nanoscale digital CMOS designs. To address this challenge, a novel built-in aging “detection” and “compensation” technique is proposed. Performance degradation is detected using a novel area- and power-efficient...
Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one of the most important reliability concerns for deep nano-scale regime VLSI circuits. Hence, aging-resilient design methodologies are necessary to address this issue in order to improve reliability, preferably with minimal impact...
The imaging laser radar is fine measure equipment for TAN with the ability to get the high precision 3D terrain. A 3D terrain matching processor was needed to be designed for the specifical application. In this paper, base on the specialty of the imaging laser radar, the3D terrain matching processor was designed, with scheme of DSP+FPGA calculating engine, multi-level memory system, flexible parallel...
A special round robin (RR) algorithm has been developed to equalize nickel metal hydride (NiMH) battery packs using a new selective equalizer. This algorithm detects batteries either at a very low state of charge (SOC) or at an extremely high SOC. In this system, a set of electromechanical relays are connected in a matrix to route boost current to the weaker batteries. The relay switching is controlled...
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