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Reliability and the mean lifetime are major aspects in today's semiconductor device manufacturing. The continuous downscaling of transistor sizes and power supplies are the root causes of higher vulnerabilities of integrated circuits against time zero process variation, time dependent degradation and random faults induced by environmental influences like particle strikes. Handling permanent faults...
A significant amount of research has been aimed at analyzing the effects of high energy particles on semiconductor devices. However, less attention has been given to the intermittent faults. Field collected data and failure analysis results presented in this paper clearly show intermittent faults are a major source of errors in modern integrated circuits. The root cause for these faults ranges from...
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