The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Not only the active devices are affected by the generated power in electronics but capacitors also suffer from the elevated temperature levels. This paper attempts transferring the concepts of the thermal transient measurement method used in the semiconductor characterization to capacitor components. We show how temperature dependent electrical parameters could be used to measure the temperature of...
This paper describes a BJT-based precision CMOS temperature sensor for high temperature (>150°C) applications. By optimizing the bias currents of the sensing BJTs and the design of the readout circuit, the impact of leakage and saturation currents at high temperatures is reduced. The sensor was implemented in a 0.16-µm CMOS SOI process and operates from −55°C to 200°C, achieving an inaccuracy of...
Proportional to Absolute Temperature (PTAT) CMOS current sources are widely used in temperature sensors, bandgap references, and other temperature-compensating circuits. Most of these applications strongly rely on the accuracy of a current ratio m established with a set of 1+m PTAT current sources. However, a PTAT CMOS current source has a temperature-dependent bias point, which in turn, has a well-known...
This paper presents an analog temperature compensation principle for capacitive sensor interfaces. For this purpose a voltage reference proportional to a reference voltage (VREF) and to relative temperature (??T) has been designed and integrated in a 1??m CMOS process. The achieved temperature measurement precision is better than 0.5??C over an operating range of 100??C.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.