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A 2-channel module for testing serial and parallel signals up to 12.8 Gbps is described. It is intended to extend the capabilities of an existing 6.4 Gbps ATE, serving as a plug-in module in an active device interface board (DIB). This prototype circuit provides (1) direct connections to ATE channels for DC parametrics and low-speed functional testing, (2) 2:1 multiplexing of 6.4 Gbps to produce 12...
A circuit for on-chip measurement of long-term jitter, period jitter, and clock skew, is demonstrated. The circuit uses a single latch and a voltage-controlled delay element, and is evaluated in a stand-alone pad frame. Excellent reproduction of jitter measured by oscilloscope is shown. Measured jitter resolution is 1 ps or better. The circuit is also incorporated into a 2 GHz clock distribution network...
A novel high-bandwidth adjustable delay circuit is described that is used for XOR-based multiplexing of multi-Gbps test signals. By precisely-aligning the phase offset of two 6.4 Gbps ATE signals, an Indium-Phosphide exclusive-OR gate is used to synthesize a double-data-rate signal with picosecond resolution and ~30 ps accuracy. The delay circuit is based on an experimentally-observed second-order...
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