The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Nowadays, the integrated circuits design and manufacturing process are decreasing the minimum transistor size and this advancement, accompanied by increasing operating frequencies and lower power supplies voltages, leads, on the one side, to the availability of fast and low power circuits with very small noise margins but, on the other side, makes integrated circuits more sensitive to Single Event...
Tolerance to soft errors has become a strict requirement in today's nanoscale CMOS designs. This paper proposes a new hardening design technique for CMOS memory cell at 32nm feature size. The proposed hardened memory cell overcomes the problems associated with the previous designs by utilizing novel access and refreshing mechanisms. Simulation shows that the data stored in the proposed hardened memory...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
We present a generic method for analyzing the effect of process variability in nanoscale circuits. The proposed framework uses kernel and a generic tail probability estimator to eliminate the need for a-priori density choice for the nature of circuit variation. This allows capturing the true nature of the circuit variation from a few random samples of its observed responses. The data-driven, non-parametric,...
A novel methodology for accurate and efficient static timing analysis is presented in this paper. The methodology is based on finding a frequency domain model for the gates which allows uniform treatment of the gates and interconnects. It is shown that despite the highly nonlinear overall gate model, a frequency domain model of the gate with the model parameters, gate moments, as functions of the...
The reliability against transient faults poses a significant challenge due to technology scaling trends. Several circuit optimization techniques have been proposed in the literature for preventing soft errors in logic circuits. However, most approaches do not incorporate the effects of other design metrics like delay and power while optimizing the circuit for soft error protection. In this work, we...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.