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There is growing concern about time-dependent performance variations of CMOS devices due to ageing-induced delay degradation. One of the main causes of ageing is Negative Bias Temperature Instability (NBTI). Existing models which predict the impact of NBTI on overall system performance assume a generic stress-recovery ratio of input signals of 50%. Such an assumption can cause misleading predictions...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.