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In order to merge low power and high voltage devices on the same chip at competitive cost, Smart Power integrated circuits (ICs) are extensively used. Electrical noise induced by power stage switching or external disturbances generates parasitic substrate currents, leading to a local shift of the substrate potential which can severely disturb low voltage circuits. Nowadays this is the major cause...
The presence of low power and high voltage devices in Smart Power integrated circuits (ICs) cause parasitic substrate interaction between switched power stages and sensitive analog blocks. This in turn is the major cause of failure of Smart Power ICs, inducing costly circuit redesign. In order to predict these harmful events, there is a need in IC industry to create a link between circuit designs,...
In order to merge low power and high voltage devices on the same chip at competitive cost, Smart Power integrated circuits (ICs) are extensively used. Electrical noise induced by power stage switching or external disturbances generates parasitic substrate currents, leading to a local shift of the substrate potential which can severely disturb low voltage circuits. Nowadays this is the major cause...
Near-field injection is a promising method in order to induce local faults in integrated circuits. This paper aims at proposing a model of the coupling between the injection probe and the circuit under test. This study relies on measurements performed on a test chip by on-chip voltage sensors.
Simultaneous switching current (SSC) drawn by integrated circuits (ICs) creates simultaneous switching noise (SSN) on power nets, which causes a number of SI/PI problems, such as reduced noise margin and eye opening with increased SSN. Analyzing the effects of SSC and SSN is especially important for ICs targeted for mobile applications whose operating frequency keeps on increasing with decreasing...
Near-field injection is a promising method in order to induce local faults in integrated circuits. This method can be used for various applications such as electromagnetic attacks on secured circuits or susceptibility investigations. This paper aims at evaluating the ability of near-field scan injection to induce local disturbances in integrated circuits. The study relies on measurements performed...
In this paper, we present an on-chip embedded current probe that uses magnetic field coupling to determine the current flowing on a target channel without breaking the circuit. A helically wound 3 dimensional on chip inductor is adopted as a current probe. We first investigate the characteristics of mutual induction for this current probing structure in various geometrical design parameters like coupling...
This paper aims at studying the near-field coupling between PCB and electromagnetic waves by using the transmission line theory. We present a model of coupling between a non-uniform electromagnetic field and a printed circuit board with an analytical resolution in the frequency domain. A first validation is made by using a plane wave excitation. In a second step, we study the coupling between a non...
A collection of slides from the author's conference presentation is given. This paper presents the diagnostic measurement for electromagnetic compatibility.
The paper focuses the attention on the reverberation chamber method for shielding properties evaluation of equipment-level enclosures. The whole testing situation, chamber plus enclosure under test, is numerically modeled by a in-house FDTD code able to predict the field inside the enclosure and the voltage captured by probes placed inside it. After the code validation, the effect of the probe position,...
Near-field antenna measurements combined with a near-field far-field transformation are an established antenna characterization technique. The approach avoids far-field measurements and offers a wide area of post-processing possibilities including radiation pattern determination and diagnostic methods. In this paper, a near-field far-field transformation algorithm employing plane wave expansion is...
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