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Tin sulphide thin films of p‐type conductivity were grown on glass substrates. The refractive index of the as grown films were calculated using both transmission and spectroscopic ellipsometry (SE) data. The SE data was fit using Tauc Lorentz model which showed that the films did not absorb for λ > 700 nm. The variation in all the films refractive index with respect to wave‐ length, i.e. the dispersion...
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