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The current method of characterizing single‐walled carbon nanotube (SWCNT) alignment utilizes single‐point measurements of a few hundred square nanometers of polarized Raman spectroscopy to characterize an entire substrate of SWCNTs on the order of square centimeters. In this study, we demonstrate a new polarized Raman spectroscopy analyzation technique of orientation Raman imaging that images areas...
We examine the interplay between intrinsic phonon properties, the variability of material properties, and instrumental uncertainty reflected in temperature‐dependent Raman spectra of inhomogeneous thin films made of two types of carbon nanotubes (metallic and semiconducting), employing statistical Raman mapping. First, we show that the contribution of temperature to Raman peaks properties representing...
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