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Raman spectroscopy is commonly used to determine the number of layers of few‐layer graphene (FLG) samples. In this work, we focus on the criteria based on the G‐band integrated intensity and on the laser optical contrast. Limitations due to stacking order are discussed and lead to the conclusion that it is necessary to combine Raman and optical contrast to avoid misinterpretation. Both methods enable...
Large‐area monolayer (1LG) and multilayer graphene (MLG) grown by chemical vapor deposition (CVD) have been of great technological importance for the graphene electronics and photonics. Such CVD‐grown MLG (CVD‐MLG) flakes consist of multiple single crystal domains, whose stacking orders can be diverse due to the various choices of layer number, stacking sequence, and twist angle. Here, we demonstrated...
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