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The small‐angle scattering invariant provides a useful tool for quantifying nanoscale morphological features in two‐phase materials, when scattering data of sufficient quality and angular range are available. In this work, an invariant analysis has been performed on small‐angle X‐ray scattering data for a series of epoxy‐amines previously found to have relatively high‐energy absorption (KE50) in ballistic...
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