It was shown that at the dynamical diffraction of spherical X-ray wave on a short period superlattice, a focusing of satellites occurred both at different depths of the superlattice and at different distances from the crystal in vacuum depending on the structural factors of the superlattice. Based on the obtained results a method for investigation of a superlattice by means of dynamical diffraction focusing of a spherical X-ray wave was proposed. The method is based on the measurement of focal distances of different satellites.