Journal of Electronic Testing
Journal of Electronic Testing > 2011 > 27 > 2 > 215-218
Journal of Electronic Testing > 2011 > 27 > 4 > 531-539
Journal of Electronic Testing > 2011 > 27 > 4 > 541-550
Journal of Electronic Testing > 2011 > 27 > 2 > 215-218
Journal of Electronic Testing > 2011 > 27 > 4 > 531-539
Journal of Electronic Testing > 2011 > 27 > 4 > 541-550