Journal of Electronic Testing
Journal of Electronic Testing > 1997 > 10 > 3 > 271-276
Journal of Electronic Testing > 1997 > 10 > 3 > 277-282
Journal of Electronic Testing > 1998 > 12 > 3 > 239-254
Journal of Electronic Testing > 1998 > 13 > 1 > 7-17
Journal of Electronic Testing > 1998 > 13 > 3 > 315-319
Journal of Electronic Testing > 1999 > 14 > 1-2 > 49-55
Journal of Electronic Testing > 1999 > 15 > 3 > 239-254
Journal of Electronic Testing > 1999 > 15 > 3 > 219-238
Journal of Electronic Testing > 2000 > 16 > 3 > 269-278
Journal of Electronic Testing > 2000 > 16 > 3 > 279-288
Journal of Electronic Testing > 2000 > 16 > 5 > 463-476
Journal of Electronic Testing > 2000 > 16 > 5 > 521-539
Journal of Electronic Testing > 2000 > 16 > 6 > 575-589
Journal of Electronic Testing > 2002 > 18 > 3 > 285-294
Journal of Electronic Testing > 2003 > 19 > 1 > 73-82
Journal of Electronic Testing > 2003 > 19 > 4 > 387-395
Journal of Electronic Testing > 2004 > 20 > 1 > 11-23
Journal of Electronic Testing > 2004 > 20 > 3 > 227-243
Journal of Electronic Testing > 2004 > 20 > 4 > 413-421
Journal of Electronic Testing > 2004 > 20 > 6 > 591-609