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The tapping-mode operation of the atomic force microscope (AFM) with an electrostatic force modulation was characterized by analyzing amplitude versus distance and amplitude versus frequency curves. This technique was applied to the modification of silicon surfaces on the nanometer scale and imaging the modified surface for the first time. Lines of different width and height were formed on ahydrogen-passivated...
Abstract. An internal reflection mode is introduced for scanning near-field optical microscopy (SNOM) with the tetrahedral tip. A beam of light is coupled into the tip and the light specularly reflected out of the tip is detected as a photosignal for SNOM. An auxiliary STM mode is used to control the distance during the scanning process and to record the topography of the sample simultaneously with...
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