The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The paper has analyzed the problems discovered in the application validation of a certain NOR FLASH for aerospace use, and clarified that the failure of this FLASH belongs to bit interference caused by over-erase. At the same time, the failure mechanism has also been analyzed, which is found to be discreteness of chip manufacturing process and incomplete coverage of the test; additionally, evasion...
Low frequency noise behavior and hot carrier injection (HCI) effect in 65nm NMOSFET was investigated in this paper. The number of oxide traps and interface traps induced by HCI effect and traps density near silicon oxide interface before and after HCI test were calculated by low frequency noise technology. It was observed that the change during HCI test was determined by low frequency noise technology.
Prognostics and health management (PHM) can ensure that a battery system is working safely and reliably. Remaining useful life (RUL) prediction, as one main approach of PHM, provides early warning of failures that can be used to determine the necessary maintenance and replacement of batteries in advance. The existing RUL prediction techniques for lithium-ion batteries are inefficient to learn the...
Because of properties of high speed, high breakdown voltage, low leakage current and high temperature resistance, silicon carbide (SiC) power devices can be used as processing units in advanced space high-power power system and high temperature propulsion power. However, the single event gate-rupture and burn-out on silicon carbide (SiC) power devices is main problem in space application for its high...
Aging and soft errors have become the two most critical reliability issues for nano-scale CMOS circuit. First, in this paper, the aging effect due to bias temperature instability (BTI) is analyzed on different logic gate using 45nm Technology, and simulated the critical charge and delay which can influence soft error rate (SER) result. Second, a method of SER calculation considering BTI effect is...
Power MOSFET plays an important role in power electronic systems, the failure of which will lead to system losing functions. Thus the degradation failure process and mechanism of MOSFET attract wide attention of scholars. However current research works cannot solve the real time degradation monitoring problem of MOSFET. Normally, MOSFET should be removed from the system for testing or monitoring....
The issue of remaining useful life (RUL) prediction has already become a quite interesting topic in industrial product. The data driven RUL prediction has been applied to the current research by taking advantage of a long-short term memory (LSTM)-recurrent neural network (RNN) approach. This means that even in a specified long-short term memory bound and limited available data sets, the RUL predictions...
The multi-stated weighted k-out-of-n (majority) systems are widely applied in various scenarios such as industrial or military applications where the ability of fault-tolerance is desirable. In this paper, a stochastic multiple-valued approach (SMVA) is proposed in order to evaluate the system efficiently. The weights and reliabilities of multi-state components are represented by stochastic sequences...
A phased-mission system (PMS) is usually consisting of a number of non-overlapping phases, and the phases should be completed sequentially to achieve a successful mission. In practice, imperfect fault coverage (IPC) plays an important effect on the system reliability. In this paper, stochastic multi-value (SMV) models are proposed to predict the system reliability of a multi-stated PMS consisting...
The traditional event tree and fault tree assume that the state of the event is fault and normal. In addition to the fault and normal state, there are many intermediate states, such as short-circuit and open-circuit, gas-hydraulic pressure lacking and so on. When using event tree and fault tree dealing with multi-state events, the computational dimension increases exponentially with the increase of...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.