The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Higher accuracy is accomplished in characterization of thin film on substrate light transmitting specimens by the envelope method. This is a result of more accurate determination of the film thickness variation, based on minimization of film thickness error metrics. Three chalcogenide thin film specimens are characterized, and is shown that their thickness error metrics are better than those for previous...
Refractive index of the substrate depending on its absorption is used in the graphical method for optical characterization of a film on a transmitting substrate, from its transmission spectrum. Three amorphous chalcogenide films on identical glass substrates are characterized by the graphical method. Indications are presented that these characterizations are more accurate than previous characterizations...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.