2014 IEEE International Electron Devices Meeting > 9.3.1 - 9.3.4
2014 IEEE International Electron Devices Meeting > 9.4.1 - 9.4.4
2014 IEEE International Electron Devices Meeting > 9.5.1 - 9.5.4
2014 IEEE International Electron Devices Meeting > 9.6.1 - 9.6.4
2014 IEEE International Electron Devices Meeting > 9.7.1 - 9.7.4
2014 IEEE International Electron Devices Meeting > 10.1.1 - 10.1.4
2014 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4
2014 IEEE International Electron Devices Meeting > 10.3.1 - 10.3.4
2014 IEEE International Electron Devices Meeting > 10.4.1 - 10.4.2
2014 IEEE International Electron Devices Meeting > 10.5.1 - 10.5.4
2014 IEEE International Electron Devices Meeting > 10.6.1 - 10.6.2
2014 IEEE International Electron Devices Meeting > 10.7.1 - 10.7.4
2014 IEEE International Electron Devices Meeting > 10.8.1 - 10.8.4
2014 IEEE International Electron Devices Meeting > 11.1.1 - 11.1.4
2014 IEEE International Electron Devices Meeting > 11.2.1 - 11.2.4
2014 IEEE International Electron Devices Meeting > 11.3.1 - 11.3.4
2014 IEEE International Electron Devices Meeting > 11.4.1 - 11.4.4
2014 IEEE International Electron Devices Meeting > 11.5.1 - 11.5.4
2014 IEEE International Electron Devices Meeting > 11.6.1 - 11.6.4
2014 IEEE International Electron Devices Meeting > 12.1.1 - 12.1.4