2013 IEEE International Electron Devices Meeting > 3.6.1 - 3.6.4
2013 IEEE International Electron Devices Meeting > 3.7.1 - 3.7.4
2013 IEEE International Electron Devices Meeting > 3.8.1 - 3.8.4
2013 IEEE International Electron Devices Meeting > 4.1.1 - 4.1.4
2013 IEEE International Electron Devices Meeting > 4.2.1 - 4.2.4
2013 IEEE International Electron Devices Meeting > 4.3.1 - 4.3.4
2013 IEEE International Electron Devices Meeting > 4.4.1 - 4.4.4
2013 IEEE International Electron Devices Meeting > 4.5.1 - 4.5.4
2013 IEEE International Electron Devices Meeting > 4.6.1 - 4.6.4
2013 IEEE International Electron Devices Meeting > 4.7.1 - 4.7.4
2013 IEEE International Electron Devices Meeting > 5.1.1 - 5.1.4
2013 IEEE International Electron Devices Meeting > 5.2.1 - 5.2.4
2013 IEEE International Electron Devices Meeting > 5.3.1 - 5.3.4
2013 IEEE International Electron Devices Meeting > 5.4.1 - 5.4.4
2013 IEEE International Electron Devices Meeting > 5.5.1 - 5.5.4
2013 IEEE International Electron Devices Meeting > 5.6.1 - 5.6.4
2013 IEEE International Electron Devices Meeting > 5.7.1 - 5.7.4
2013 IEEE International Electron Devices Meeting > 6.1.1 - 6.1.4
2013 IEEE International Electron Devices Meeting > 6.2.1 - 6.2.4
2013 IEEE International Electron Devices Meeting > 6.3.1 - 6.3.4