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Power noise waveforms within cryptographic VLSI circuits in a 65 nm CMOS technology are captured by using an on-chip voltage waveform monitor (OCM). The waveform measurements emphasize the correlation of dynamic voltage drops to internal logical activities during the processing of Advance Encryption Standard (AES), and resolve the physical processes in the information leakage of such as secret key...
In this contribution, a comprehensive approach to predicting conducted emissions produced by a switched-mode power converter is presented. The prediction is based on a SPICE model. As an example, a DC-DC-converter is analyzed. Both the semiconductors (MOSFET, diode etc.) and the passive discrete elements as inductors and capacitors are modeled by processing datasheet information, manufacturer-provided...
Recent products have been pursuing the values such as high performance and miniaturization that are hard to coexist at the same time. Accordingly, a lot of quality issues such as structural stiffness guarantee, thermal diffusion technique and electro-magnetic compatibility problem are raised. Among these quality issues, a major evaluation method of robustness for external electro-magnetic shock is...
Power integrity is a serious issue in the modern CMOS digital systems, because power supply noise excited in core circuits induces logic instability and electromagnetic radiation. Therefore, chip-package co-design is becoming important by taking into consideration the total impedance of power distribution network (PDN) seen from the chip. Especially, parallel resonance peaks in the PDN due to the...
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