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Continuous technology advancements have forced MOSFET architecture to evolve from bulk to SOI to multigate MOSFETs. BSIM compact models have helped circuit designers to realize their designs first time correct using accurate physical models used in SPICE simulation. BSIM3 and BSIM4 are threshold voltage based bulk MOSFET models while BSIM6 is charge based bulk MOSFET model, which include physical...
A 2D physics-based model for short-channel junctionless double gate (DG) MOSFETs is presented. From a closed-form solution for the 2D potential we derive explicit equations for the calculation of threshold voltage VT and subthreshold slope S. A unified charge model valid for all operating regimes is developed by using Lambert's W-function, and a standard smoothing function for the transition between...
Methods of a MOSFET threshold voltage extraction have been briefly described. A possibility of their application for characterization of a fully-depleted SOI MOSFETs has been discussed. A simple method for SOI MOSFET threshold voltage characterization has been proposed. The concept has been verified based on experimental data obtained for SOI MOSFETs manufactured in ITE.
Currently electro-thermal simulations performed with 3D FEM simulators like ANSYS or COMSOL Multiphysics are limited to an imposed current flow through resistive materials. However, in the case of power MOS gated transistors like VDMOS transistors or IGBT, the channel resistance evolves with the gate voltage. This phenomenon is usually neglected in ON-state applications but seems to be determinant...
This paper presents the effect SOI detector's bias voltage has on current-voltage characteristics of different types of transistors (core transistors, io transistors, body floating, sourcetie, body-tie, low/normal/high threshold voltage). Methods of minimizing this effect were presented. Also, the I–V characteristic of transistors utilizing shielding layer (BPW - buried P Well) were measured and presented...
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