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In this paper a method to estimate the leakage power consumption of CMOS digital circuits taking into account input states and process variations is proposed. The statistical leakage estimation is based on a pre characterization of library cells considering correlations (ρ) between cells leakages. A method to create cells leakage correlation matrix is introduced. The maximum relative error achieved...
To characterize statistical moments of cell delays and slopes, the standard method is Monte Carlo (MC) method. However, this method suffers from very high computational cost. In this paper, we propose a technique to quickly and accurately estimate Standard Deviation (SD) of standard cell delays and slopes. The proposed technique is based on the identification, performed with a reduced set of MC simulations,...
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