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Electron and hole mobility in sub-10nm silicon nanowire FETs on (100) SOI has been systematically investigated experimentally. The nanowire height of fabricated nanowire FETs is as low as 4 - 10nm and the minimum nanowire width is shrunk to 5nm. Higher hole mobility than (100) universal mobility is experimentally observed for the first time in 9nm-wide nanowire and even in 5nm-wide nanowire, while...
22nm node Si SOI Coplanar “N Channel Vertical Dual Carrier Field Effect Transistors” (VDCFET) and its SOC with effective channel length less than 10nm for communication applications are presented.
In this work we report the main results of a research activity on a novel device concept which aims to achieve a steep switching behavior based on the filtering of high-energy electrons in the FET source region. The filtering function is entrusted to a superlattice in the source extension, which could possibly be fabricated by depositing a number of appropriate semiconductor layers within the manufacturing...
The electrical transport behavior of carbon nanotube field-effect transistors (CNT-FETs) decorated with gold nanoparticles (NPs) has been investigated. After decoration with Au NPs, the Ion/Ioff ratios of nanotube FETs decrease and some of the p-type devices even change into metallic ones. The Au NPs decrease the contact resistances between the CNTs and metal electrodes, and accordingly increase the...
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