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We successfully achieved the reduction of the parasitic resistance and the mobility enhancement in Si nanowire transistors (NW Tr.) by raised source/drain extensions with thin spacer (<;10nm) and by stress induced from heavily-doped gate. Id variations are suppressed by the spacer thinning. By adopting <;100> NW channel instead of <;110> NW, Ion = 1 mA/μm for Ioff = 100 nA/μm is achieved...
Using theoretical calculations, we explain why some metal atoms like Ni produce bulk silicides and the others such as Au never produce silicides, why silicides with some stoichiometry are difficult to grow on Si substrate, why Schottky barrier for electrons simply decreases as the Si ratio in silicides increases, and how the dopants change Schottky barrier. It is shown that the keys to answer these...
By utilizing an electron-cyclotron-resonance plasma enhanced chemical vapor deposition (CVD) for low-temperature epitaxial growth of group IV semiconductors, atomically controlled plasma processing has been developed to achieve atomic-layer doping and heterostructure formation with nanometer-order thickness control as well as smooth and abrupt interfaces. In this paper, recent typical achievements...
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