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The development of a novel technique for measuring HPA (High Power Amplifiers) AM (Amplitude Modulation) and PM (Phase Modulation) noise is reported. The new method utilizes a dual channel microwave downconverter and a 16-bit high-speed digitizer to directly sample the IF allowing digital demodulation of AM and PM noise simultaneously. A prototype AM/PM noise measurement system has been built with...
Particular problems can occur for frequency synthesizers under vibration and temperature. These effects will be outlined for providing margin to prevent failures. Phase noise, noise figure, and spectrum analysis tools are applied with vibration tables and thermal chambers. Particular focus is given to frequency synthesizers whose oscillators are most susceptible to environmental effects.
System integration testing (SIT) is still relied upon for final confirmation of data link products. SIT, a costly process, is still required for most circuit card sub-assemblies because of the risk that lower level testing is either insufficient or incomplete. A description of production testing and debug is presented.
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