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Along with decrement in size of nanoelectronic devices, they are more prone to the effects of transient faults. Therefore, investigating the effects of such faults is of great importance. Due to high count of transistors in nanoelectronic devices, performing simulation by HSPICE is a time consuming process. Hence, several mathematical models have been proposed. However, our proposed model is simple...
This paper explores custom instruction identifying methodologies for critical code segments of embedded applications, considering the locality in selection algorithms. We propose two policies for selection of custom instructions. In the first approach, called local selection, the structurally equal custom instructions are classified into the same group, called template, and the selection of custom...
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