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The problem of detection of control flow errors in software has been studied extensively in literature and many detection techniques have been proposed. These techniques typically have high memory and performance overheads and hence are unusable for real-time embedded systems which have tight memory and performance budgets. This paper presents two algorithms by which the overheads associated with...
Cryptographic devices are recently implemented with different countermeasures against side channel attacks and fault analysis. Moreover, some usual testing techniques, such as scan chains, are not allowed or restricted for security requirements. In this paper, we analyze the impact that error detecting schemes have on the testability of an implementation of the advanced encryption standard, in particular...
Encryption algorithms could suffer fault injection attacks in order to obtain the secret key. In this paper, a specific protection for any round-based encryption algorithm is presented, analyzed and tested. It is providing a high degree of robustness together with a small penalty in the algorithm throughput when dealing with specific intentional attacks. Experimental results on advanced encryption...
This paper presents an efficient high-level synthesis (HLS) approach to improve RT-level concurrent testing. The proposed method used for both fault detection and fault location. At first the available resources are used in their dead intervals to test active resources for fault detection, and then some changes are applied to the RT-level controller to locate the faults. The fault detection step is...
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
We propose a built-in scheme for generating all patterns of a given deterministic test set T. The scheme is based on grouping the columns of T, so that in each group of columns the number ri of unique representatives (row subvectors) as well as their product R over all such groups is kept at a minimum. The representatives of each group (segment) are then generated by a small finite state machine (FSM)...
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