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Fitting a circuit model to measured data is usually accomplished by matching the model's calculated 'S' parameters to the target's 'S' parameters as measured on a VANA over the model's operating frequency range. For electrically " long" structures, several wavelengths long at the upper modelling frequency and poor starting values, the conventional technique leads to convergence difficulties...
This paper presents the results of a study to establish the limitations and accuracy of commercially available CAD simulators for microstrip discontinuities, commonly referred to as the corner, step, tee and cross [l]. Measured S-parameters of these discontinuities fabricated on a 100 micron GaAs substrate are compared against results from TOUCHSTONE, SUPER COMPACT, EMsim and SONNET simulators. Results...
The standard " Load Pull Test" provides one of the most important specifications for microwave oscillators, which is the maximum change in frequency and power for a constant VSWR of the load at all phases. The way this method is commonly used however delivers reliable results only for the frequency pulling. In power pulling it bears systematic errors due to the variation of coupling factor...
Multi-state microwave devices such as digitally controlled phase shifters, attenuators and transmit receive modules must be tested in a great number of different device states. This causes the test time of these devices to be a significant part of their production cost. This paper presents the test time reductions that may be achieved through the use of a high speed microwave receiver instead of the...
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach.
We compare the ability of three different equivalent-circuit extraction methods to give ensembles of model parameters that accurately predict not only average S-parameters but the S-parameter statistics the standard deviations and intercorrelations between the real and imaginary parts. Measurements were made for 400 GaAs MESFET's fabricated on a single wafer with an MBE-grown active layer. Data is...
While the last decade has seen an explosion of microwave software, experimental validation efforts have seen little effort. As a result, most published validation efforts are, justifyably, viewed with skepticism. Thus, when an analysis is to be validated, it must be validated again and again for, and by, each group of users, often at considerable expense. This paper describes areas for improvement...
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