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This paper presents the role that ATPG fault diagnostic tools can play in driving physical device analysis. Barriers exist between the logical fault diagnostic domain and the physical device analysis domain. These barriers are being removed through the application of software tools that use design place-and-route data to bridge the gap between logical and physical domains. A case study in the use...
The random-like filling strategy pursuing high compression for scan test introduces large test power. To pursue high compression in conjunction with reducing test power for multiple scan chain designs is even harder and very few works were dedicated to solve this problem. This paper proposes and demonstrates a multilayer data copy (MDC) scheme for test compression as well as test power reduction for...
It is now generally accepted that the stuck-at fault model is no longer sufficient for many manufacturing test activities. Consequently, diagnostic test pattern generation based solely on distinguishing stuck-at faults is unlikely to achieve the resolution required for emerging fault types. In this work we describe a new diagnostic ATPG implementation that uses a generalized fault model. It can be...
As electronic design feature sizes continue to shrink and clock speeds continue to rise, more and more companies have turned to at-speed test techniques to help ensure high test and product quality. Due to incomplete timing information during automatic test pattern generation (ATPG), it is possible that some at-speed patterns may activate paths which are not required to meet system speed, and these...
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