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We discuss the applicability of the displacement damage dose method and the non-ionizing energy loss (NIEL) concept to the effect of protons on GaAs devices. Comparison of the relative damage coefficients (RDCs) for different GaAs devices with the energy dependence of the proton NIEL shows differences for proton energies >10 MeV. However, since actual RDCs are always bound between the total and...
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